Nano-R™ - Atomic Force Microscope from Pacific Nanotechnology
The Pacific Nanotechnology Nano-R™ Metrology AFM sets a new standard in atomic force microscopy for nanotechnology, nanoscience and nanoinspection applications. It is designed to make the highest quality images and measurements of materials and structures with nanometer scale dimensions. The Nano-R™ is ideal for both independent researchers and for research teams that want to share an AFM.
Advanced features of the Nano-R™ include a high resolution motorised focus/zoom video microscope, a motorised X-Y sample positioning system and an advanced scan calibration system. This integrated approach makes the Nano-R™ very intuitive to use.
The Nano-R™ is a complete AFM system. It includes a control computer, control electronics, control software, analysis software, probes and a stage. With the Nano-R™ you can begin scanning immediately.
