Category : Measurement, test and control instrumentations > Thickness measurement equipment

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The DUALSCOPE® MP20E-SE-S Coating thickness measuring instrument uses both the magnetic induction and the eddy current test method. It offers an economical solution if applications call for measurements on ferromagnetic and on non-ferrous materials and if there is no need for hard copy documentation. It will automatically recognize the material to be measured and utilize the appropriate test method.
The DUALSCOPE® MP20E-SE-S also features a unique and easy-to-read, 60 x 30 mm (2.4" x 1.2") LCD display. The information packed display makes operation incomparably simple. Displayed information includes individual measurement data, measurement number, statistical data, product specification limit violation, date, time, icons and symbols to indicate operation mode and settings, and two text lines for 16 alphanumeric or freely definable symbols per line to display data and operator prompts.
The DUALSCOPE® MP20E-SE-S allows the user to interchange a wide variety of Fischer Smart Probes for different applications. This unlimited ability to interchange probes with the unit allows the operator to cover diverse measurement applications simply by changing probes .

This instrument has a RS232 interface and enables data storage (for a max. of 5000 readings for each measuring method). The RS232 interface allows for the documentation of measurement data using computers or printers.

The DUALSCOPE® MP20E-SE-S is ideal for measuring:
- Non-ferrous metal coatings (e.g. chromium, copper, zinc etc.) on steel and iron
- Paint, lacquer and synthetic coatings on steel and iron
- Non-conductive coatings on non-ferrous metals such as paint, lacquer, synthetics on aluminum, copper, brass, zinc and stainless steel
- Anodized coatings on aluminum
- One-step measurement of the individual thickness of a paint/zinc coating system (duplex coating) on steel

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List of articles in this sub-category

- MicroMesure II modular measurement system
- FG710 Infrared Gauge for film thickness measurement
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- BOLTS Ready Integrated Metrology Module
- F50 spectral reflectance system
- F20 spectrometry system

List of all articles in this sub-category Thickness measurement equipment

List of all articles in this sub-categoryList of all articles in this sub-categoryList of all articles in this sub-category