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Category : Motion control, positioning stages > Scanning stages

, Improve Resolution of CCDs and other Image Sensors

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Auburn, MA. PI (Physik Instrumente) introduces the world's fastest XY scanning stages for applications such as pixel-multiplication, image dithering and other types of high-precision scanning operations.

Typical Applications: Imaging, Scanning Microscopy.

How does it work?
P-733 scanning stages provide 0.1 nanometer positioning resolution in XY and XYZ. They can move from one position to another in a millisecond or less, or run in continuos mode at scanning rates of hundreds of hertz, up to 4 times higher than other scanning stages. This improvement is achieved by a very stiff, parallel-kinematics piezoceramic direct drive design resulting in an extremely high resonant frequency of 2.3 kHz.
Due to the parallel-kinematics layout (all actuators drive a single moving platform) both the X and Y axis achieve identical dynamic performance, a prerequisite for improved imaging speed and linearity.

Parallel Metrology for faster Control:
Equipped with 0.1 nanometer resolution direct capacitive position feedback in a parallel-metrology configuration the new stages also achieve better straightness of travel. Parallel metrology can “see” all controlled degrees of freedom simultaneously and compensate for the slightest off-axis motion in real time. The benefits are faster response, reduced phase lag and off-axis errors, with straighter motion and improved repeatability.

Features & Advantages:
* Fastest Multi-axis Closed-Loop Scanning Stages on the Market
* 0.1 Nanometer Closed Loop Resolution
* 2.3 kHz Resonant Frequency (XY): 400 % Faster than Comparable Systems
* Capacitive Feedback for Lower Noise
* XY & XYZ Motion with 30x30 µm and 30x30x10 µm Travel
* Parallel Metrology for Highest Multi-Axis Linearity & Stability
* Parallel Kinematics Design for Improved Response and Symmetrical XY Dynamics
* Negligible EMI (piezo drives do not create magnetic fields nor are they influenced by them)
* Vacuum Compatible

Article from PI (Physik Instrumente) L.P.


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List of all articles in this sub-category Scanning stages

List of all articles in this sub-categoryList of all articles in this sub-categoryList of all articles in this sub-category