Category : Optics (components, coatings, instruments and systems) > Microscope, microscope accessories

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The design of the Alpha-SNOM features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument.

The AlphaSNOM uses an extremeley precise capacitively-controlled piezo platform to scan the sample in three dimensions. The stage is used not only in SNOM and AFM, but also in confocal mode. Therefore, it is possible to analyze the same sample area with different techniques and combine the benefits of all three modes.

By simply rotating the objective turret, the user can choose from among Confocal Microscopy, SNOM or AFM. For scanning near-field optical microscopy, the AlphaSNOM uses unique micro-fabricated Cantilever SNOM Sensors, that significantly outperform standard fiber optical probes in resolution, transmission, ease of operation and reliability.

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List of all articles in this sub-category Microscope, microscope accessories

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