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Category : Motion control, positioning stages > Nanopositioning (components and systems)
Calibration of vertical dimensions on a nanometric scale
SILIOS TECHNOLOGIES, specialist in optical microtechnology, supplements its range of products with standards for the calibration of vertical dimensions on a nanometric scale (lower than 20 nm).
These standards find their application in the field of metrology and particularly microscopes AFM (Atomic Force Microscopes) and SPM (Scanned Probes Microscopes).
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