Category : Data Acquisition and signal processing > Signal processing

PRINT

BACK

Our EPP-Series gauge block calibration system is based on a new metrological method in which the upper inductive probe normally used is replaced by one of our Model LM 20 laser-interferometric gauging probes with a measuring range of 20 mm and a resolution of 1 nm. The German standards institute, the Physikalisch-Technische Bundesanstalt Braunschweig, determined that using this type of probe allows holding metric errors to 10 nm or less over 15 mm, which, in turn, allows reducing the total number of standard gauge blocks required and comparing gauge blocks with differing lengths. A proprietary calibration technique allows determining system linearity errors (errors due to misalignment, probe tilt, and thermal effects). The system is easy to operate from a PC running "Parallel Gauge Block Calibration" (PEKAL) signal-processing and control software, which also corrects, processes, and outputs metrological data.

List of all articles from this supplier

- PT Series optical interference testing rig for applanation tonometers
- NMM-1 Nano Positioning and Nano Measuring Machine
- SP plane-mirror miniature interferometers used for making precision length measurements
- LM laser interferometric gauging probes

List of all articles from this supplier

List of articles in this sub-category

- eXpert™ Finite Impulse
- Electronic timing relays
- Isolated Analog Signal Conditioners
- SHM-50 designed for analog signal processing applications
- TPG128 pulse generator
- 3PI X-X pulse generator delivers powerful square wave pulses

List of all articles in this sub-category Signal processing

List of all articles in this sub-categoryList of all articles in this sub-categoryList of all articles in this sub-category