Category : Measurement, test and control instrumentations > Thickness measurement equipment

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Thickness and optical constants (n and k) are measured quickly and easily with the F20 advanced spectrometry system. Spectral analysis of reflectance from the top and bottom of the thin film provides thickness, refractive index, and extinction coefficient in less than a second. The entire desktop system sets up in minutes and can be used by anyone with basic computer skills.

The F20 includes everything required for measurements: spectrometer, light source, fiber optic cable, sample stage, and Windows™ application software — just add your computer

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- BOLTS Ready Integrated Metrology Module
- F50 spectral reflectance system
- F40 Microscope-based Thickness Measurement System
- F80 Thickness measurement tool

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List of articles in this sub-category

- MicroMesure II modular measurement system
- FG710 Infrared Gauge for film thickness measurement
- TMS200 Thickness measurement equipment
- BOLTS Ready Integrated Metrology Module
- F50 spectral reflectance system
- F40 Microscope-based Thickness Measurement System

List of all articles in this sub-category Thickness measurement equipment

List of all articles in this sub-categoryList of all articles in this sub-categoryList of all articles in this sub-category