|
Category : Measurement, test and control instrumentations > Thickness measurement equipment
F40 Microscope-based Thickness Measurement System
|
|
 |
| PRINT |
|
 |
| BACK |
|
Thickness is measured quickly and easily with Filmetrics advanced spectrometry systems. Spectral analysis of reflections from the top and bottom of the thin film provides thickness in seconds.
For measurements on patterned surfaces and other applications that require a spot size as small as 10 microns, just add the model F40 to your microscope. For common microscopes the F40 is a simple bolt-on attachment, complete with a c-mount for a CCD camera.
List of all articles from this supplier
- BOLTS Ready Integrated Metrology Module
- F50 spectral reflectance system
- F20 spectrometry system
- F80 Thickness measurement tool
List of all articles from this supplier
List of articles in this sub-category
- MicroMesure II modular measurement system
- FG710 Infrared Gauge for film thickness measurement
- TMS200 Thickness measurement equipment
- BOLTS Ready Integrated Metrology Module
- F50 spectral reflectance system
- F20 spectrometry system
List
of all articles in this sub-category Thickness measurement equipment
List of all articles in this sub-categoryList of all articles in this sub-categoryList of all articles in this sub-category
|