Category : Cameras, image sensors, imaging systems, scanners, thermography, UV viewers > Imaging systems, image processing

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At typical imaging conditions (1 nA probe current, 25 mm working distance, 25 keV beam voltage), the 2LE can resolve features smaller than 20 nm. With the ability to easily adjust the probe current anywhere in the range from 1 pA to 100 nA, the 2LE provides the total current and current density for most analytical applications.

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List of all articles in this sub-category Imaging systems, image processing

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