Category : Cameras, image sensors, imaging systems, scanners, thermography, UV viewers > X-ray imaging system

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The Integrated EDS system combines the LEO 1400's and 1500's series SEM and IXRF EDS user interfaces into a single application. The EDS toolbar is accessed directly from the SEM user interface allowing advanced microanalysis features to be performed directly on the live SEM image. All EDS data can be stored in a single file.

Advanced Features (included with every system)

Quantitative EDS, X-ray Mapping, and Linescan analysis in a single application
Complete spectrum processing including escape and sum peak removal, automatic background removal, and net peak extractions using Gaussian deconvolution
Quantitative analysis using ZAF, with or without standards
Quantitative Spectral Matching
Automated acquisition and analysis of spectra from selected spots or areas on the image
Definable Phase X-ray Mapping by Wt%
FastMap technology stores all spectral data with each X-ray Map pixel (PTS Maps)
FastLinescan technology stores all spectral data with each linescan point (PTS Linescans)

List of all articles from this supplier

- Linescan Software Overview
- 500 digital pulse processor
- Imaging, x-ray mapping and particle analysis
- Digital imaging and X-ray mapping

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List of articles in this sub-category

- XQ7002 Replacement Camera Tube
- PIXIS-XO direct detection camera
- REX™ Roadside X-ray Explosive Device Detection
- LEXID™ X-ray Imaging Device
- X-ray detector
- Lexitek papa position-sensitive photon-counting focal plane detector

List of all articles in this sub-category X-ray imaging system

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