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Category : Cameras, image sensors, imaging systems, scanners, thermography, UV viewers > X-ray imaging system

Imaging, x-ray mapping and particle analysis

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The Integrated EDS system combines the JEOL 5510, 5610, and 5910 series SEM and IXRF EDS user interfaces into a single application. The EDS toolbar is accessed directly from the SEM user interface allowing advanced microanalysis features to be performed directly on the live SEM image. All EDS data, along with the SEM image is stored in a single file.

Advanced Features (included with every system)

EDS, Imaging, X-ray Mapping, and Particle analysis in a single application
Complete spectrum processing including escape and sum peak removal,
automatic background removal, and net peak extractions using Gaussian deconvolution
Quantitative analysis using ZAF, with or without standards
Quantitative Spectral Matching
Automated acquisition and analysis of spectra from selected spots or areas on the image
Definable Phase X-ray Mapping by Wt%
FastMap technology stores all spectral data with each X-ray Map pixel (PTS Maps)
FastLinescan technology stores all spectral data with each linescan point (PTS Linescans)
Automated Single Field particle analysis
Model 500 EDS Hardware

Digital Pulse Processor with programmable gain and pulse pileup rejection
Programmable time constants 0.3, 0.5, 1, 2, 4, 8, 16, 32 (microseconds)
32-bit, 4096 channel multi-channel analyzer (MCA) PCI interface card
Automatic energy calibration
Adjustable detector bias
LN Monitor with bias shutdown for detector warm up protection
Digital Pulse Processor logic is downloaded from the PC for simple field upgrades
Built in, on board oscilloscope
Width x Height x Depth 315 x 112 x 250 mm (12.4 x 4.4 x 9.8 inches)
Weight 4.5 kg (10 lbs.)
Voltage 100/120/220/240 V AC user selectable. 47-63 Hz, 85 VA Maximum
Safety Standard EN61010-1 Electrical equipment for lab use, Electro Magnetic Compliance EN55022 Class A, EN50082-1, CE-mark

Article from IXRF SYSTEMS, Inc.


List of all articles from this supplier

- Linescan Software Overview
- 500 digital pulse processor
- Digital imaging and X-ray mapping
- IXRF EDS Integration for LEO

List of all articles from this supplier


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List of all articles in this sub-category X-ray imaging system

List of all articles in this sub-categoryList of all articles in this sub-categoryList of all articles in this sub-category