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Category : Cameras, image sensors, imaging systems, scanners, thermography, UV viewers > X-ray imaging system
Imaging, x-ray mapping and particle analysis
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The Integrated EDS system combines the JEOL 5510, 5610, and 5910 series SEM and IXRF EDS user interfaces into a single application. The EDS toolbar is accessed directly from the SEM user interface allowing advanced microanalysis features to be performed directly on the live SEM image. All EDS data, along with the SEM image is stored in a single file.
Advanced Features (included with every system)
EDS, Imaging, X-ray Mapping, and Particle analysis in a single application Complete spectrum processing including escape and sum peak removal, automatic background removal, and net peak extractions using Gaussian deconvolution Quantitative analysis using ZAF, with or without standards Quantitative Spectral Matching Automated acquisition and analysis of spectra from selected spots or areas on the image Definable Phase X-ray Mapping by Wt% FastMap technology stores all spectral data with each X-ray Map pixel (PTS Maps) FastLinescan technology stores all spectral data with each linescan point (PTS Linescans) Automated Single Field particle analysis Model 500 EDS Hardware
Digital Pulse Processor with programmable gain and pulse pileup rejection Programmable time constants 0.3, 0.5, 1, 2, 4, 8, 16, 32 (microseconds) 32-bit, 4096 channel multi-channel analyzer (MCA) PCI interface card Automatic energy calibration Adjustable detector bias LN Monitor with bias shutdown for detector warm up protection Digital Pulse Processor logic is downloaded from the PC for simple field upgrades Built in, on board oscilloscope Width x Height x Depth 315 x 112 x 250 mm (12.4 x 4.4 x 9.8 inches) Weight 4.5 kg (10 lbs.) Voltage 100/120/220/240 V AC user selectable. 47-63 Hz, 85 VA Maximum Safety Standard EN61010-1 Electrical equipment for lab use, Electro Magnetic Compliance EN55022 Class A, EN50082-1, CE-mark
Article from IXRF SYSTEMS, Inc.
List of all articles from this supplier
- Linescan Software Overview
- 500 digital pulse processor
- Digital imaging and X-ray mapping
- IXRF EDS Integration for LEO
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List
of all articles in this sub-category X-ray imaging system
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