JSM-6490 scanning electron microscope

PRINT

BACK

The JSM-6490 is a high-performance, scanning electron microscope with a high resolution of 3.0nm. Its asynchronous five-axis mechanically eucentric stage with compeucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter (12-inches loadable). Standard automated features include Auto Focus/Auto Stigmator, Auto Gun (saturation, bias and alignment), and Automatic Contrast and Brightness.

Other features include:

Fast, unattended data acquisition
Smart settings for common samples
Streamlined design
Compact footprint
Customized toolbars for repetitive functions
Enhanced SE imaging
Super conical lens
Can be field upgraded for Low Vacuum
Large specimen chamber
New features include:

Improved low kV imaging
Multiple live image display (including picture in picture)
Signal mixing
Live, full screen image
Video capability (.avi files)

Article from JEOL (Europe) S.A.

List of all articles from this supplier

- Cross section polisher : sample preparation device
- JWS-2000 for defect inspection
- AccuTOF™-GC for a qualitative and quantitative analysis
- JEM-1011designed to view the finest cell structures

List of all articles from this supplier

List of articles in this sub-category

- Point projection microscope
- MID for Biological Fluorescence Microscopy
- Olympus PM-30 camera system
- High-precision foil successfully developed for SAM systems
- TAO module : perfect solution for advanced experiments combining AFM and optical spectroscopy
- NanoWizard microscope used in optical microscopy

List of all articles in this sub-category Microscope, micro-inspection system, microscope accessories

List of all articles in this sub-categoryList of all articles in this sub-categoryList of all articles in this sub-category