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Leading-edge pulse measurement capabilities enhance Keithley's device characterization expertise

Cleveland, Ohio, July 2005 * * * Keithley Instruments, Inc.
(NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of pulse generation and measurement in the Model 4200-SCS Semiconductor Characterization System. Completely integrated in a compact form factor, the new PIV (Pulse I-V) Package enables superior measurements and faster time-to-market for leading-edge researchers working with high-k materials, thermally sensitive devices, and advanced memory chips. It is the first commercially available solution to offer accurate and repeatable pulse and DC measurements in an easy-to-use, integrated package.

The PIV Package is an option for Keithley's Model 4200-SCS System. The Model 4200-SCS performs laboratory grade DC device characterization, real-time plotting, and analysis with high precision sub-femtoamp resolution. It offers the most advanced capabilities available in a fully integrated characterization system, including a complete embedded PC with Windows XP operating system and mass storage.

The Need for Pulse Measurements

As semiconductor technology evolves to the 65nm node and beyond, measurement techniques other than DC source-measure are necessary to effectively characterize new materials and devices due to new problems such as high-k charge trapping and self-heating in SOI (silicon on insulator) devices. While leading-edge developers have recognized the need for pulse testing, there have been no commercially available solutions for easy, accurate, and repeatable pulse measurements. The Model 4200-SCS PIV Package with pulse capability solves this problem through tight integration of pulse generation, pulse measurement, patent-pending software, and simplified interconnects to the device under test (DUT). Users no longer have to fumble with racks of equipment, complicated wiring connections, internally developed software, and questionable measurement results. Keithley's new pulse capability is integrated into its proven Model 4200-SCS platform, making precision DC and pulse measurements available in one measurement solution under Keithley's proven KTEI semiconductor test software.

New Pulse I-V Capability for the Model 4200-SCS

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