Category : Measurement, test and control instrumentations > Non-contact measurement

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The MC940 is the version with direct distance reading of our capacitive electronics. Once connected to our MCC sensors, this box is used for all applications of the non-contact dimensional metrology on a conductive object, in static or in dynamic. Fitted with one or two measurement channels and a limit value monitoring, it enables to detect defaults or sorting in a production line. The MC940 VF version is suited to vibration measurement.
Examples of application :
- Wafer, foil thickness measurement…
- Spindle runout measurement
- Gauge block control,
- Tool characterization for ultrasonic machine (amplitude, frequency)

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- TMS 2000 non-contact microroughness measurement system
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List of all articles in this sub-category Non-contact measurement

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