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Category : Spectroscopy, colorimetry, photometry, fluometry > Spectroscopy
MTEC MicroLap for Depth Profiling
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Enables layer-by-layer FT-IR Spectroscopy of layered and gradient composition samples with no limit on the depth range that can be probed.
Produces depth profiles of composition on a micrometer scale.
Allows measurements of composition to any desired depth withou the limitation of beam penetration distance.
Utilizes the latest microlapping technology to precisely remove material layer-by-layer.
Precision digital gauge monitors layer removal on a micrometer scale.
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of all articles in this sub-category Spectroscopy
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