Category : Measurement, test and control instrumentations > Dimensional measurements 2D/3D

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Leuven, April 14th 2005 – Metris, the market leader for CMM based laser scanning applications today announces the simultaneous acquisition of Krypton N.V. (Leuven, Belgium) and MetricVision, Inc. (Virginia, Washington, USA). Total funds in excess of 20 million euro have been raised to finance the acquisition and integration of the two privately held companies.
Krypton (Leuven, Belgium), is a high-tech product company developing and producing solutions for quality control and testing, based on highly accurate linear camera technology. The Krypton K-systems are portable, hand-held optical coordinate measuring machines, with a proven track record in engineering and pre-production applications. Major Automotive OEM customers, such as BMW, DaimlerChrysler, Ford, GM, PSA, Toyota, Volkswagen etc. have already recognized the value of this new technology that combines high dynamic accuracy with portability and ease of use.
Beside the portable CMM business, Krypton is also the market leader for robot-cell calibration and robot performance testing, enabling enhanced accuracy in robotic applications. The Krypton solution turns off-line programming into an easy and accessible task, enabling tremendous savings on robot programming and thus manufacturing down time.
MetricVision (Virginia, USA) develops and manufactures unique precision 3D measurement laser radars based on its patented coherent laser radar technology. Laser radar is the only solution available that provides automated, non-contact measurement capability for large-volume applications of up to 60 meter radius. These portable or fixed installation systems are currently in use by companies around the world in a variety of industries, including aerospace, automotive and power generation. Applications range from the inspection and in-process control of aircraft and spacecraft components to the inspection of large automotive and heavy vehicle parts and molds.

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List of all articles in this sub-category Dimensional measurements 2D/3D

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