Category : Measurement, test and control instrumentations > Surface analysis instrumentation

BUYER'S GUIDE

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The Model 100 and the enhanced Model 200 Profilometers are uniquely capable of measuring mid-scale, or mid-spatial frequency surface errors - those with typical widths ranging from a fraction of a millimeter to a few tens of millimeters. These profilometers work on the innovative, patented principal of measuring local surface curvature. This completely self-referencing technique gives remarkable insensitivity to all types of vibration and mechanical and thermal drift, giving Angstrom-level accuracy without requiring precise reference surfaces or translation mechanisms. In addition to providing standard surface quality measures such as RMS, RA, and Peak-to-Valley, the profilometers allow a full range of analysis options, including polynomial removal and the calculation of Power Spectral Density (PSD) and autocovariance function.
These instruments are suitable for the profiling of aspheric and anamorphic optical surfaces, as exemplified by NASA's use of a Model 200 to measure the Hubble Space Telescope corrective optics. The Model 200 received the 1992 Photonics Spectra Circle of Excellence Award.

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