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Category : Optics (components, coatings, instruments and systems) > Optical instrumentation, systems and accessories
Model 9910 Parametric Tester
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Die on sub-mount testing High bandwidth current source for fast LVI data collection Ultra precise optical alignment for external cavity devices Parameterized data output for pass/fail criteria Hardware customized to meet your specifications Open source code for your modifications Complete turn-key solution Reliable and state-of-the-art performance Proven in production environment
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of all articles in this sub-category Optical instrumentation, systems and accessories
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