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Category : Optics (components, coatings, instruments and systems) > Optical instrumentation, systems and accessories

Model 9910 Parametric Tester

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Die on sub-mount testing
High bandwidth current source for fast LVI data collection
Ultra precise optical alignment for external cavity devices
Parameterized data output for pass/fail criteria
Hardware customized to meet your specifications
Open source code for your modifications
Complete turn-key solution
Reliable and state-of-the-art performance
Proven in production environment

Article from VueMetrix


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