Category : Sensors, probes, transducers > AFM probes, scanning probes for microscopes

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Neuchâtel/Switzerland, October 29, 2005. NANOSENSORS™ today announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and an enhanced signal to noise ratio for UHV applications.

Based on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7nm.

The first product of the new Q30K-Plus line will be commercially available starting January 2006 in the following versions: PPP-QFMR and PPP-QNCHR. Other types for different operation modes and different tip shapes are being developed.

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