NanoWizard microscope used in optical microscopy

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The JPK Instruments NanoWizard ® Atomic Force Microscope (AFM) bridges the worlds of optical microscopy and scanning probe microscopy by the press of a single button. The simultaneous availability of all optical microscopy features together with a high performance AFM gives the operator unrivaled flexibility and enables continuous mapping from the microscale to the nanoscale.

Key features
Proven stand-alone technology
Hardware linearization in all 3 axis also for closed loop measurements
Most stable platform for higest flexibility
Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...)
Works in native environment: real in-situ measurements
Large scan range of 100µm x 100µm x 15µm
Virtual instruments - control the system via the internet

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