Category : Sensors, probes, transducers > AFM probes, scanning probes for microscopes

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Neuchâtel/Switzerland, February 17, 2006. NanoWorld today officially announced its new Pyrex-Nitride AFM probe.

The Pyrex-Nitride probe combines silicon nitride cantilevers and tips with the proven glass chip concept. These new probes will be available as rectangular cantilevers as well as in a triangular version. The Pyrex-Nitride series has been designed for a great variety of imaging techniques like in air and liquid. The cantilevers have a backside reflective coating of chromium and gold.

The Pyrex-Nitride probes will become commercially available in June 2006.

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List of all articles in this sub-category AFM probes, scanning probes for microscopes

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