Category : Optics (components, coatings, instruments and systems) > Optical instrumentation, systems and accessories

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A novel planar, folded-piezo, flexure scan design allows simultaneous lateral and axial sample scanning as well as providing coarse inertial positioning.

The ultra thin package and open optical axis permits the scanner to be incorporated into systems where conventional scan stages are too bulky. This unique device, developed for Nanonics' near-field scanning optical microscope, is now available as a standalone addition to all scanning applications.

An ultra thin 7mm piezo-electric scanning stage

Large scan range up to 70um in the XY plane
Z-scanning over 70um
Completely free optical axis
Access to the sample from above and below

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List of all articles in this sub-category Optical instrumentation, systems and accessories

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