Category : Sensors, probes, transducers > AFM probes, scanning probes for microscopes

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Improved Consistency and Resolution through an Advanced Tip Manufacturing Process

Neuchâtel, August 1st, 2004 –

NANOSENSORS™ today announced its new product, the PointProbe® Plus that will be replacing the Pointprobe-Silicon-SPM-Sensor.

The new PointProbe® Plus (PPP) AFM probe combines the well-known features of the proven PointProbe® Series such as high application versatility and compatibility with most commercial AFMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™
Rue-Jaquet-Droz 1
CH-2007 Neuchâtel
Switzerland

Phone: +41-(0)32-720-5085
Fax: +41-(0)32-720-5792
Email: info@nanosensors.com

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