New technique provides defect selective recognition of material failure

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CEDIP Infrared Systems, specialists in thermal IR technology, have released a new technical paper that describes a new technique that provides defect selective recognition of material failure.

Ultrasound Excited Thermography is a new non-destructive testing / non-destructive examination technology developed and patented in a cooperative venture with IKP (University of Stuttgart) and Enhanced Defect Visualisation GmbH.

Based upon the interaction of elastic and thermal waves, the paper describes how Ultrasound Excited Thermography provides a unique method of detection of mechanical hysterisis in materials caused by cracks, delaminations, poor bonding or other material weaknesses. Technical background to the technique is discussed and several applications of the technology as applied in the automotive industry illustrated.

The paper shows how the new technique can be used to rapidly and efficiently inspect areas as large as 0.5 x 0.5 metres. Beneficially Ultrasound Excited Thermography can detect cracks independent of their orientation. Consequently even sub-surface cracks can be found, which provides a considerable advantage over traditional and time consuming colour penetration tests.

For a copy of this technical paper please contact CEDIP Infrared Systems.

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