PVX-2505 PIV Pulse Generator

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The I-V characteristics of semiconductor devices are functions of frequency and temperature. Curve tracers and other "DC" test systems typically step through a range of gate voltages and, at each gate voltage, sweep the drain voltage over the measurement range. The device essentially reaches thermal equilibrium and electronic (semiconductor-trap) equilibrium at each point, yielding different test characteristics than actual RF operational characteristics.

By pulsing the device using a pulse generator and taking a measurement during the pulse, the measurements can be taken before the device heats up. This circumvents the thermal effects associated with conventional "DC" testing, more closely approximates the characteristics of the device when operating at high frequencies, and doesn't activate the semiconductor "traps".

The design of these pulse generators provide fast rise and fall times, with minimal overshoot, undershoot and ringing. These controlled voltage waveforms allow the device under test (DUT) to stabilize at voltage within a few hundred nanoseconds, allowing I-V measurements to be made before device heating begins. The PVX-2505 features instrument-quality voltage and current monitors, providing a straight-forward means of measuring the voltage and current ofthe device under test.

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