Category : Semiconductor equipment > Probe card analyzers

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The probeWoRx System w/ fast 3D-OCM is the next generation probe card production metrology system. Featuring Applied Precision's "Hi-Speed 3-dimensional Optical Comparative Metrology" at its core, this revolutionary new technology enables a breakthrough in overall system performance for both speed and accuracy. The probeWoRx system delivers lightning-fast test times (10x faster than current industry standards), higher accuracy and repeatability, and the ability to measure the largest and most complex probe cards in "one-touch" with fully automated "lights-out" operation. This is the first probe card metrology system to perform all necessary testing for both Fabs and probe card manufacturers at the highest speeds, with no compromise to accuracy or repeatability, eliminating the probe card testing bottlenecks of the past. Taking your test times from hours to minutes.

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