Category : Semiconductor equipment > Probe card analyzers

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The probeWoRx system eliminates the issues of conventional mechanical probe card analyzers using a novel optical measurement concept for probe alignment and planarity based on continuous scan, three-dimensional comparative metrology. Key attributes regarding the revolutionary nature of probeWoRx are:

Hi-Speed Planarity & Alignment Measurement

The single touch, continuous scan of all probes at zero and nominal overtravel dramatically reduces test times.
Probes are measured optically, so planarity and alignment test times are unaffected by the presence of bussed probes, relays and/or capacitors.
Saves operator time by automatically loads and unloads all necessary testing plates.
The high level of integrated automation minimizes operator intervention, thus greatly reducing any chance for probe card damage due to excessive probe card handling during testing.

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