Category : Optics (components, coatings, instruments and systems) > Microscope, microscope accessories

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The Pulsed Force Mode (PFM) is a non-resonant, intermediate-contact mode for Atomic Force Microscopy (AFM). When added to an AFM System as an external unit, the PFM extends the capabilities of the microscope beyond simply measuring topography to include the investigation of such properties as local stiffness and adhesion. It also avoids the surface damage that can result from operating in contact mode on soft samples.
The Pulsed Force Mode extension integrates quickly and easily with virtually any Atomic Force Microscope, whether commercially available or custom-made. It is offered in two versions: The standard PFM and the new Digital PFM. Please contact us to find out more about extending the capabilities of your system.

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- Digital Pulsed Force Mode
- Mercury 100 AFM microscope
- UHTS 300 spectroscopy system
- Alpha-SNOM microscope

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- VS-MS C-mount co-axial unit for microscope objective lens
- Microscope Objectives and Eyepieces
- ZMM - 1 Monocular Zoom Microscope
- Nomad scanning probe microscope
- Universal SPM Scanning probe microscope
- Q-Scope 400 scanning probe microscope

List of all articles in this sub-category Microscope, microscope accessories

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