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Category : Semiconductor equipment > Wafer test/inspection and measurement systems

Pyramid Probes for RF Applications

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The RFC Pyramid Probe card provides state-of-the-art signal integrity for microwave/RF, analog, or high-speed digital IC production test. Microstrip transmission lines maintain impedance control all the way to the bond pad. Patented ground and power planes with bypass capacitors provide resonance-free power supplies directly to the IC.

Article from Cascade Microtech,


List of all articles from this supplier

- Pyramid Probes
- Pyramid Probes for Large Scale ICs
- RFC Pyramid Probe Edge Series
- Pyramid Probes for High-Speed Digital Applications

List of all articles from this supplier


List of articles in this sub-category

- nHance CMP system for failure analysis
- WSB2 Wafer Substrate Bonding Unit
- Blackstar: Silicon Dicing System for semiconductor wafers
- FabExpress™ designed to handle 200mm to 300mm Semiconductor Wafers
- Viper 2430 Automated macro-defect inspection system
- Surfscan SP1 DLS surface inspection system

List of all articles in this sub-category Wafer test/inspection and measurement systems

List of all articles in this sub-categoryList of all articles in this sub-categoryList of all articles in this sub-category