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Category : Semiconductor equipment > Wafer test/inspection and measurement systems
Pyramid Probes for High-Speed Digital Applications
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Today's smaller die sizes challenge test engineers to bring more I/O to shrinking design perimeters. Cascade's MSI Pyramid Probe Series increases the number of I/O channels available for RF and high-speed digital test applications. Its large probe surface makes multi-DUT testing both technically feasible and economically advantageous.
Article from Cascade Microtech,
List of all articles from this supplier
- Pyramid Probes
- Pyramid Probes for Large Scale ICs
- RFC Pyramid Probe Edge Series
- Pyramid Probes for RF Applications
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of all articles in this sub-category Wafer test/inspection and measurement systems
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