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Category : Optics (components, coatings, instruments and systems) > Microscope, microscope accessories
Q-Scope 250 scanning probe microscope
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SofTouch™: Patented method of gentle approach of the probe to the sample avoids damage to the sample surface (particularly in soft samples). Q-Lithic™ Stage: Solid granite base and support arch for excellent mechanical and thermal stability. Includes Z-axis motion control hardware. Isotopic Focal System™: Patented optical system which allows the laser beam to track the cantilever/probe during scanning, greatly increasing sensitivity and virtually eliminating laser light reflections from the sample. It also permits for a 90 degree top-down view, providing for easy laser alignment and positioning of the probe over sample features to be scanned. AnaLoop™: Patented analog feedback loop that is digitally controlled with inputs from the keyboard or mouse. It combines the advantages of an analog loop, such as no quantizing errors, with a sampling frequency that is three times faster than current digital feedback loops, obtaining three times the number of data points at equivalent scan rates. Fast and Automatic Approach: The beta version of a totally automatic approach has been released that drives the probe toward the sample surface at high speed until it first senses the surface. Then it changes to a slow, soft approach that allows the probe to gently engage the surface and enter feedback condition.
Article from Quesant Instrument Corporation
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