Category : Machine vision related products, inspection applications with industrial vision or scanning systems > Inspection systems

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Moritex Europe has chosen the forthcoming Photonex 2004 (6-7th October) exhibition at Stoneleigh Park, Coventry, UK to show its latest products for industrial inspection and imaging applications.

On Photonex Stand IS22, Moritex Europe will be officially launch its MG-WAVE next generation LED lighting system range that provides state-of-the-art lighting and lens conditions. MG-WAVE lighting provides longer stable images than other forms of lighting. Unlike other forms of lighting there is no deterioration caused by repeatedly switching the light on and off. Operating across a narrow bandwidth MG-WAVE makes it easy to acquire the contrast critical for image processing. Incorporating small light source elements enables MG-WAVE to deliver lighting dimensions optimised to application.

The exhibitions will mark the first European public appearance of Moritex's new MS-804 digital video microscope system - an affordable microinspection station that combines high performance with flexibility and ease of use. The MS-804 incorporates both CCD camera and high brightness LED light source for fast and simple acquisition of high resolution images (1280 x 960 pixel) with unrivalled depth-of-field. Available with a range of zoom lens (16x - 200x) the MS804 is able to undertake almost any microinspection application.

Also on show will be Moritex`s newly extended range of halogen light sources. Engineered to stand up to the demanding environments of industrial inspection and machine vision Moritex halogen light sources are an excellent choice for all your illumination needs. Using a proprietary operating cycle Moritex quartz halogen lamps provide a steady, stable output (+/- 1%) at a higher colour temperature (>3000K) and over a longer life span (500-2000 hours) than incandescent bulbs. Designed for safety and reliability the light sources are highly resistant to heat shock.

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List of all articles in this sub-category Inspection systems

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