Category : Measurement, test and control instrumentations > Non-contact measurement

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The fastest, highest resolution, most stable non-contact microroughness measurement system in the world. Advanced light scatter technology packaged into a system ideally suited for qualifying and quantifying full surface textures and zone microroughness testing. For the first time surface measurements on glass and ceramic disk and wafer surfaces are now possible with new light scatter technology from
the leader in the field of light scatter. Discover the ultimate answer to fast, reliable microroughness measurements in glass/ceramic disk manufacturing, with systems that simplify lab to manufacturing correlation.

Features
Non-Contact Measurements cannot harm
test surfaces
Results – RA, RMS roughness from 1Å up to 500Å
Cost – Lower costs than Profilometer, AFM
or Interferometers
Precision – Resolution of 0.01Å reproducibility +/-0.5Å or 1% and repeatability: +/-0.2 Å
Speed – Typically 50 test points in 60 sec.

Benefits
Quadruple Production Throughput
Increased Performance/Quality
Unaffected by environmental conditions
Minimal operator training required
Lowest cost per measurement of any system
Stable – Easy to use
Correlates to other measurement instruments via slope/offset.

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List of articles in this sub-category

- Uniscan 3D Laser Profilometer designed for non-contact measurement
- Contactless Measurement of Distances and Layer Thicknesses
- S series sensors designed to fit all standard applications where a non-contact sensor can be used
- ZX-1 micro Bench-Top
- Autocollimators designed for non contact measurement
- Measuring Products: Hawk Automated – Vision Engineering

List of all articles in this sub-category Non-contact measurement

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