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Boundary-Scan is a test technique standardized by the IEEE organization which is more and more used in the electronic community in order to be able to face the production test requirements both technically and financially speaking.

Boundary Scan tests arise first in the early phases of the development of complex PCB and so is firstly used by design engineers in order to validate their designs. According to the fact that most of the manufacturing departments use In-Circuit test systems for their PC Boards production test, it is now important to be able to run on existing ICT testers (large investment already done) Boundary scan tests coming from testers used by the design peoples.

On a production line of electronic boards where In-Circuit testers (ICT) are the main production testers, the integration of Boundary-Scan test (BST) may cause some problems:
- Complete production test using two steps on two independent testers. The boards after being declared PASS for ICT test are convoyed towards BST tester. This solution requires two test fixtures, increases the production test time and is more difficult to handle for high volume production.
- One Step Test using two test systems integrated on the same platform. BST Tester is integrated in ICT tester. This hardware integration - and maybe also a software one - requires a minimum of co-operation between the suppliers of BST and ICT testers.
- One step test on ICT test system. Taking into account the cost of a BST tester, and assuming that ICT testers resources are at least equivalent regarding the performances requested, WildScan proposes an innovating step in the field of the one step test.

WildScan Concept:
WildScan is a product that makes it possible to transfer a Boundary-Scan test (BST) program to an In-Circuit tester (ICT) without needing any complementary hardware integration in the In-Circuit tester. The same test fixture can then be used from the Boundary-Scan test program development to production test on the In-Circuit tester.

WildScan analyzes the following test sequences:
- Infrastructure test.
- Interconnections test.
- Cluster test.
- EPLD and the FPGA Programming (excepted for FLASH EPROM which requires particular algorithms).
And then a complete set of test sequences including Boundary-Scan bus (TDI, TDO, TCK, TMS) test vectors and parallel channels test vectors is generated.
The quality of GO/NOGO test is maintained during conversion. The BST diagnostic is transferred as an integrated part of the In-Circuit Test program or using WildScan diagnosis facilities

Technical Description:
- Pure software translation: don't require additional hardware in your In-Circuit Tester
- Goepel data importer. ASSET and JTAG Techologies can be developed on request.
- Specific file generation. Supports many In-Circuit Testers (Agilent, GenRad, IFR, Rohde & Schwarz, Schlumberger, Teradyne)
- Standard file generation (flat EDIF 2.0 netlist, BSDL model, JEDEC Wave, Serial Vector Format)
- Convert Boundary-scan parallel accesses into standard In-Circuit Channels
- Multi-platform software running on PC, Sun/Sparc (Solaris)

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