Website : http://www.tecan.co.uk List of published articles : New stencil technology boosts lead-free production yields Tecan ultra-clean lid perfectly encapsulate expensive hybrid electronics packages Microcomponent specialist creates growth in two distinct areas Highly-polished squeegees boost lead-free paste performance New stencil technology improves paste release and definition Labyrinth RFI screening at design stage pays dividends Leading drive manufacturer replaces all stencil frames with Genesis Microstructure specialist delivers millions of micro-calibration bars Global demand for precision metal parts prompts US expansion Micro-part specialist delivers micro-acoustic application success Versatile optical encoder disc facility produces optimum results Polar explorer selects leading-edge technology for micro-parts Low-cost semiconductor leadframes from fast alternative source Next-generation mesh pushes research boundaries to new levels PCB Rework stencils deliver repeatable accuracy Titanium anodising leader creates environmentally friendly process Success for microstructure specialist in European R&D initiative Combinational stencils satisfy current and next-generation needs Sieves And Meshes Are Bio-World's Most Accurate Single-source for high-performance hybrid package lids Low-profile surface-mount screening is fast and efficient Hybrid metal-polymer microstructures deliver design freedom Superior optical encoders result from enhanced lithography Rapid prototyping and pre-production part validation Cost-effective process delivers burr and stress free metal parts Multi-level stencils optimise post-print rework costs TECAN introduces Multi-level evaporation masks are robust and accurate PEF sieves ensure 100% of material is accounted for Unique new QC tool qualifies and quantifies Tecan laser scanners Rework stencils deliver repeatable accuracy - Tecan Board-level RFI screening technology cuts assembly time - by 80% Tecan releases four software packages that unite to integrate your data Grids for mass spectrometers, electron microscopes
